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Spectral characterization of PIC devices is key to test accuracy

The challenge of testing complex photonic integrated circuits (PICs) remains a key requirement to speed production while improving device reliability and the quality of finished products. EXFO describes key issues and solutions for improved testing of passive PIC components.

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EXFO accelerates ‘lab to live’ for next-generation optics with new, innovative test solutions

Next-gen transceiver and field testing advancements to be unveiled at ECOC 2022 to support high-speed networking, data center evolution and FTTx deployments.

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We did it big time – Bynet Electronics ordered the largest single order from Aukua Systems

We are happy to be the loyal partner for Aukua systems – a leading provider of precision Ethernet testing and visibility solutions. Looking forward to break the record again.

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